May 11, 2021 – 10:00-11:00 AM EDT
This presentation will describe the principles of 3D Raman imaging and the speaker will show in detail how to access chemical imaging at the highest spatial and spectral resolution. Comprehensive analyses of samples often require a combination of different techniques. Structural information on a sample’s surface can be obtained by Atomic Force Microscopy or Scanning Electron Microscopy (SEM).
Raman imaging can reveal its chemical composition and by combining the techniques, structural and chemical information can be easily acquired from the same sample position. These approaches will be described and the power of correlative Raman-AFM and Raman-SEM imaging for analysis will be illustrated in the contexts of energy storage devices, semiconductors and 2D materials.