TopMap Micro.View is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful metrology solution. With an extended 100 mm Z measurement range and the CST Continuous Scanning Technology, Micro.View measures complex topographies at nm resolution. This convenient table-top setup features integrated electronics, with the smart focus finder simplifying and speeding up the measurement procedure.
- Measure surface finish in a compact setup with nm resolution
- 100 mm Z-measurement range with
- CST Continuous Scanning Technology
- Cost-effective quality control solution
- High-end white-light interferometer
- With Focus Finder and Focus Tracker ready for automation
- Motorized X, Y, Z, tip/tilt and turret save repositioning